The following directory lists the graduate courses which the University expects to offer, although the University in no way guarantees that all such courses will be offered in any given academic year, and reserves the right to alter the list if conditions warrant. Click on the links below for a list of courses in that subject area. You may then click “View Classes” to see scheduled classes for individual courses.
Grading Basis: Graded
Introduction to the concepts and techniques of VLSI (very large scale integration) design verification and testing, details of test economy, fault modeling and simulation, defects, automatic test pattern generation (ATPG), design for testability (DFT), scan and boundary scan architectures, built-in self-test (BIST) and current-based testing. State-of-the-art tools are used for ATPG, DFT, test synthesis and power analysis and management.
No classes found.